Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 26, Issue 7, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0268-1242/26/7/072001
Keywords
-
Categories
Funding
- EPSRC, UK [EP/F033311/1, F035721/1]
- EPSRC [EP/D032210/1, EP/F033311/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/D032210/1, EP/F033311/1] Funding Source: researchfish
Ask authors/readers for more resources
We show that deep level doping of Czochralski-grown silicon wafers is capable of providing high resistivity handle wafers suitable for radio frequency integrated circuits. Starting from n-type Czochralski silicon wafers having a nominal resistivity of 50 Omega cm, we use ion implantation and subsequent annealing to increase the resistivity of the wafers to over 10 k Omega cm at room temperature. Coplanar waveguides fabricated on implanted wafers show strongly reduced attenuation down to 0.3 dB mm(-1) from 0.8 dB mm(-1) for un-implanted wafers in the 1-40 GHz range, providing clear evidence that the technique is effective in improving performance of passive devices at GHz range frequencies.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available