Journal
SCIENTIFIC REPORTS
Volume 5, Issue -, Pages -Publisher
NATURE PUBLISHING GROUP
DOI: 10.1038/srep11876
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Funding
- European Community [280804]
- Sectoral Operational Programme Human Resources Development (SOP HRD) from European Social Fund
- Romanian Government [POSDRU/159/1.5/S/137390/]
- [PN-II-PT-PCCA-2011-3.2-1162]
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A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.
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