Journal
SCRIPTA MATERIALIA
Volume 66, Issue 11, Pages 919-922Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2012.02.034
Keywords
Thin films; Rupture strain; Stretchable conductors; Flexible electronics
Categories
Funding
- NIH [NINDS R21 052794]
- New Jersey Commission for Science and Technology
- New Jersey Commission on Brain Injury Research
- NSF [0856540, 0928278]
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [0928278] Funding Source: National Science Foundation
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [0856540] Funding Source: National Science Foundation
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Experiments show that the rupture strain of gold conductors on elastomers decreases for conductors that are long and narrow. Rupture is caused by the irreversible coalescence of microcracks into one long crack. A mechanics model identifies a critical crack length l(cr) above which the long crack propagates across the entire conductor width l(cr) depends on the fracture toughness of the gold film and the width of the conductor. The model provides guidance for the design of highly stretchable conductors. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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