Journal
SCRIPTA MATERIALIA
Volume 65, Issue 2, Pages 67-72Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2010.09.025
Keywords
SOFC; Microstructure; Electrodes; FIB-SEM; Tomography
Categories
Funding
- National Science Foundation [DMR-0907639]
- UChicago Argonne, LLC [DE-AC02-06CH11357]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [0907639] Funding Source: National Science Foundation
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In this work we demonstrate the utility of three-dimensional focused ion beam-scanning electron microscopy nanotomography for understanding composite electrode performance and degradation. Phase connectivity, electrochemically active triple-phase boundary density and phase tortuosity are calculated for a series of anodes with varying Ni-YSZ composition. These structural characteristics, achievable only through three-dimensional interrogation, are shown to play a vital role in determining electrode polarization resistance. Additionally, Ni-YSZ samples are experimentally annealed in hydrogen and reconstructed to quantitatively assess degradation as a function of reduced triple-phase boundary density. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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