Journal
SCRIPTA MATERIALIA
Volume 64, Issue 10, Pages 962-965Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2011.01.045
Keywords
Thin films; Surface diffusion; Surface energy; Facets; Surface anisotropy
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Funding
- Israel Science Foundation [775/10]
- Russell Berry Nanotechnology Institute at the Technion
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A model describing the retraction kinetics of a fully faceted edge of a single crystalline thin film deposited on a non-wetting substrate is proposed. The kinetics of retraction is very similar to that of a fully isotropic film. The calculated topography profile of the edge exhibits a single maximum and no local minima (depressions). The implications for the solid-state dewetting mechanisms are discussed. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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