Journal
SCRIPTA MATERIALIA
Volume 62, Issue 8, Pages 536-539Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2009.12.017
Keywords
Magnesium; Microcompression; Dislocations; Focused ion beam (FIB); Compression test
Categories
Funding
- National Science Foundation [IGERT 0801471]
- Army Research Laboratory [ARMAC-RTP W911NF-06-2-0006]
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Single-crystal magnesium micropillars are fabricated using focused ion beam (FIB) milling. The micropillars are loaded in compression along the [0 0 0 1] c-axis. The stress-strain curves from these microcompression experiments reveal significant strain hardening, and post-mortem microscopy reveals traces of pyramidal slip on the deformed specimens. Transmission electron microscopy (TEM) specimens are excised from the micropillars using FIB, and TEM analysis confirms the presence of pyramidal dislocations as well as < c > dislocations. No twinning is observed. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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