Journal
SCRIPTA MATERIALIA
Volume 63, Issue 3, Pages 312-315Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2010.04.019
Keywords
Severe plastic deformation (SPD); Nanocrystalline materials; Transmission electron microscopy (TEM); Intermetallic FeAl
Categories
Funding
- University of Vienna
- IC Experimental Materials Science Nanostructured Materials
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A method yielding a quantitative profile analysis from electron diffraction is worked out and combined with the local information gained from transmission electron microscopy images; it is applicable to various nanomaterials. As an example, small nanocrystalline regions are analyzed that form in FeAl by severe plastic deformation. The result is unexpected as the coherently scattering domain size does not change as a function of strain. At high strains, the sample is homogeneously nanocrystalline and the results agree well with those of X-ray diffraction. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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