Journal
SCRIPTA MATERIALIA
Volume 63, Issue 9, Pages 921-924Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2010.07.005
Keywords
Cryogenic deformation; Electron backscatter diffraction; Copper; Nanocrystalline microstructure
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High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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