Journal
SCRIPTA MATERIALIA
Volume 58, Issue 2, Pages 96-98Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2007.09.033
Keywords
self-annealing; electroplating; texture; grain growth; silver
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In situ quantitative X-ray diffraction analysis was used to investigate the kinetics of microstructure evolution at room temperature (self-annealing) in an electrodeposited silver layer. As a function of time at room temperature the as-deposited nanocrystalline microstructure evolved considerably: orientation-dependent grain growth and changes of the preferred grain orientation occurred. It is demonstrated for the first time that self-annealing occurs for electrodeposited silver layers and, hence, is not a unique feature of copper as often suggested. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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