Journal
SCANNING
Volume 30, Issue 5, Pages 365-380Publisher
WILEY-HINDAWI
DOI: 10.1002/sca.20124
Keywords
Monte Carlo; secondary electron yield; low energy; inelastic mean free path; d band
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Funding
- EPSRC
- EPSRC [EP/C53087X/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/C53087X/1, EP/C536045/1] Funding Source: researchfish
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The secondary electron (SE) yield, 6, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of (5 but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30: 365-380, 2008. (C) 2008 Wiley Periodicals, Inc.
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