Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 85, Issue 7, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4887343
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Funding
- National Natural Science Foundation of China (NNSFC)
- NSAF [11172221, U1330111]
- (U.S.) DOE [DE-AC02-06CH11357]
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We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation. (C) 2014 AIP Publishing LLC.
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