Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 2, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4788732
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Funding
- Carl Zeiss Stiftung
- Deutsche Forschungsgemeinschaft [TR 18]
- Laserlab Europe
- Volkswagen-Stiftung
- German Ministry for Education and Research-Bundesministerium fur Bildung, Forschung und Technologie (BMBF) [FSP 301]
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We report on the absolute sensitivity calibration of an extreme ultraviolet (XUV) spectrometer system that is frequently employed to study emission from short-pulse laser experiments. The XUV spectrometer, consisting of a toroidal mirror and a transmission grating, was characterized at a synchrotron source in respect of the ratio of the detected to the incident photon flux at photon energies ranging from 15.5 eV to 99 eV. The absolute calibration allows the determination of the XUV photon number emitted by laser-based XUV sources, e. g., high-harmonic generation from plasma surfaces or in gaseous media. We have demonstrated high-harmonic generation in gases and plasma surfaces providing 2.3 mu W and mu J per harmonic using the respective generation mechanisms. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4788732]
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