Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4776672
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Funding
- National Science Foundation (NSF) through the Materials Research Science and Engineering Center at Harvard (MRSEC) [DMR-0820484]
- NSF [ECS-0335765]
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Modern confocal microscopes enable high-precision measurement in three dimensions by collecting stacks of 2D (x-y) images that can be assembled digitally into a 3D image. It is difficult, however, to ensure position accuracy, particularly along the optical (z) axis where scanning is performed by a different physical mechanism than in x-y. We describe a simple device to calibrate simultaneously the x, y, and z pixel-to-micrometer conversion factors for a confocal microscope. By taking a known 2D pattern and positioning it at a precise angle with respect to the microscope axes, we created a 3D reference standard. The device is straightforward to construct and easy to use. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4776672]
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