Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4756691
Keywords
-
Categories
Ask authors/readers for more resources
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4756691]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available