Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 12, Pages -Publisher
AIP Publishing
DOI: 10.1063/1.4770124
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Funding
- NASA-JPL thermoelectrics group
- Danish National Research Foundation (Center for Materials Crystallography)
- Danish Strategic Research Council (Center for Energy Materials)
- U.S. National Science Foundation (NSF) MRSEC program-REMRSEC Center [DMR-0820518]
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The implementation of the van der Pauw (VDP) technique for combined high temperature measurement of the electrical resistivity and Hall coefficient is described. The VDP method is convenient for use since it accepts sample geometries compatible with other measurements. The technique is simple to use and can be used with samples showing a broad range of shapes and physical properties, from near insulators to metals. Three instruments utilizing the VDP method for measurement of heavily doped semiconductors, such as thermoelectrics, are discussed. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4770124]
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