Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 82, Issue 2, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3549133
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We have developed an x-ray beam-position monitor for detecting the radiation properties of an x-ray free electron laser (FEL). It is composed of four PIN photodiodes that detect backscattered x-rays from a semitransparent diamond film placed in the beam path. The signal intensities from the photodiodes are used to compute the beam intensity and position. A proof-of-principle experiment at a synchrotron light source revealed that the error in the beam position is reduced to below 7 mu m by using a nanocrystal diamond film prepared by plasma-enhanced chemical vapor deposition. Owing to high dose tolerance and transparency of the diamond film, the monitor is suitable for routine diagnostics of extremely intense x-ray pulses from the FEL. (C) 2011 American Institute of Physics. [doi:10.1063/1.3549133]
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