4.5 Article

Cryogenic ultra-low-noise SiGe transistor amplifier

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 82, Issue 10, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3655448

Keywords

-

Funding

  1. EU
  2. Federal Ministry for Education and Research of Germany (BMBF) [RUS 10/015]
  3. Slovak Research and Development Agency [APVV-0515-10, 24240120032]

Ask authors/readers for more resources

An ultra-low-noise one-stage SiGe heterojunction bipolar transistor amplifier was designed for cryogenic temperatures and a frequency range of 10 kHz-100 MHz. A noise temperature T(N) approximate to 1.4 K was measured at an ambient temperature of 4.2 K at frequencies between 100 kHz and 100 MHz for a source resistance of similar to 50 Omega. The voltage gain of the amplifier was 25 dB at a power consumption of 720 mu W. The input voltage noise spectral density of the amplifier is about 35 pV/root Hz. The low noise resistance and power consumption makes the amplifier suitable for readout of resistively shunted DC SQUID magnetometers and amplifiers. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3655448]

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available