4.5 Article

Study on the effect of measuring methods on incident photon-to-electron conversion efficiency of dye-sensitized solar cells by home-made setup

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 10, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3488456

Keywords

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Funding

  1. Natural Science Foundation of China [20725311, 20673141, 20703063, 20873178, 20721140647]
  2. Ministry of Science and Technology of China [2006CB202606, 2006AA03Z341]
  3. 100 Talents and Knowledge Innovation Foundation of the Chinese Academy of Sciences [KJCX2-YW-W27, KGCX2-YW-363]

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An experimental setup is built for the measurement of monochromatic incident photon-to-electron conversion efficiency (IPCE) of solar cells. With this setup, three kinds of IPCE measuring methods as well as the convenient switching between them are achieved. The setup can also measure the response time and waveform of the short-circuit current of solar cell. Using this setup, IPCE results of dye-sensitized solar cells (DSCs) are determined and compared under different illumination conditions with each method. It is found that the IPCE values measured by AC method involving the lock-in technique are sincerely influenced by modulation frequency and bias illumination. Measurements of the response time and waveform of short-circuit current have revealed that this effect can be explained by the slow response of DSCs. To get accurate IPCE values by this method, the measurement should be carried out with a low modulation frequency and under bias illumination. The IPCE values measured by DC method under the bias light illumination will be disturbed since the short-circuit current increased with time continuously due to the temperature rise of DSC. Therefore, temperature control of DSC is considered necessary for IPCE measurement especially in DC method with bias light illumination. Additionally, high bias light intensity (> 2 sun) is found to decrease the IPCE values due to the ion transport limitation of the electrolyte. (C) 2010 American Institute of Physics. [doi:10.1063/1.3488456]

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