Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3360826
Keywords
heat radiation; optical microscopes; phototransistors
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Funding
- Japan Science and Technology Agency (JST)
- Grant-in-Aid for Young Scientists (Start-up)
- Mitutoyo Association for Science and Technology
- Sumitomo Foundation
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A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.
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