Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3427223
Keywords
electrostatic lenses; metal-insulator transition; photoelectron spectra; polarimetry; spin dynamics; thin films
Categories
Funding
- Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U. S. Department of Energy [DE-AC02-05CH11231]
Ask authors/readers for more resources
We describe a spin-resolved electron spectrometer capable of uniquely efficient and high energy resolution measurements. Spin analysis is obtained through polarimetry based on low-energy exchange scattering from a ferromagnetic thin-film target. This approach can achieve a similar analyzing power (Sherman function) as state-of-the-art Mott scattering polarimeters, but with as much as 100 times improved efficiency due to increased reflectivity. Performance is further enhanced by integrating the polarimeter into a time-of-flight (TOF) based energy analysis scheme with a precise and flexible electrostatic lens system. The parallel acquisition of a range of electron kinetic energies afforded by the TOF approach results in an order of magnitude (or more) increase in efficiency compared to hemispherical analyzers. The lens system additionally features a 90 degrees bandpass filter, which by removing unwanted parts of the photoelectron distribution allows the TOF technique to be performed at low electron drift energy and high energy resolution within a wide range of experimental parameters. The spectrometer is ideally suited for high-resolution spin- and angle-resolved photoemission spectroscopy (spin-ARPES), and initial results are shown. The TOF approach makes the spectrometer especially ideal for time-resolved spin-ARPES experiments. (C) 2010 American Institute of Physics. [doi:10.1063/1.3427223]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available