Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3321313
Keywords
Raman spectroscopy; spectrometers; surface enhanced Raman scattering; surface plasmon resonance
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Funding
- National Natural Science Foundation of China [20773045, 20627002, 20903043, 20973075]
- Research Fund for the Doctoral Program of Higher Education of China [20090061120089]
- 111 Project [B06009]
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A surface plasmon resonance (SPR)-surface enhanced Raman scattering (SERS) microspectrometer was designed to obtain the incident angle dependence of SERS signals excited by the evanescent field. By simultaneous measurement of the SERS and SPR spectra of analytes, the highest SERS signal intensities were found to appear at the vicinity of the resonance angle. The enhancement factor was about 2.0x10(6). The simulated angle of the maximal SERS intensity based on Fresnel equation was found to be in good agreement with the experimental results. The SERS and SPR spectra captured simultaneously not only directly confirm the correlation between the SERS and SPR but also present a potential technique for obtaining the structure information about the analytes in molecule level with recording their SPR curves.
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