Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 80, Issue 6, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3152367
Keywords
atomic force microscopy; brittle fracture; crystals; sample holders
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We report on sample holders for crystals to be cleaved for the preparation of surfaces with large atomically flat terraces. The concept for mounting sample crystals is based on a vicelike clamping mechanism to securely hold the crystal in position while reducing the risk of fragmentation. Sample holders based on this concept and made of suitable materials allow preparation and cleavage of crystals in the ultrahigh vacuum at high or low temperatures. To cleave the crystal, we employ a scalpel blade mounted on a wobble stick to generate a highly localized stress field initiating the cleavage process. The sample holders are used for experiments of highest resolution scanning force microscopy, however, the concept can be transferred to any other system where cleavage faces of crystals are of interest. Exemplarily, scanning force microscopy results demonstrate that (111) cleavage faces of CaF(2) crystals can be prepared with steps only a few F-Ca-F triple-layers high and atomically flat terraces extending over areas of several mu m(2).
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