Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 79, Issue 12, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3046284
Keywords
atomic force microscopy; cantilevers; colloids; electrolytes; silicon compounds; surface chemistry
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Funding
- University of Louisville Office
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The development of colloidal probe microscopy has made it possible to directly measure the interaction forces between two different surfaces in solution. Cantilever calibration is presently a subject of intense experimental and theoretical interest due to the need for accurate force measurement. We developed a novel and direct calibration method for colloidal probe cantilevers to which a silica microsphere has been previously attached based on fitting experimental force curves for the interaction between the silica sphere and a silica flat in dilute KBr solutions to the theoretical Derjaguin, Landau, Verwey, and Overbeek force curves using the measured zeta potential of the silica surfaces.
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