4.7 Article

Effects of corn on C- and L-band radar backscatter: A correction method for soil moisture retrieval

Journal

REMOTE SENSING OF ENVIRONMENT
Volume 114, Issue 11, Pages 2417-2430

Publisher

ELSEVIER SCIENCE INC
DOI: 10.1016/j.rse.2010.05.017

Keywords

Active microwave; Vegetation effects; Soil moisture; Corn; Field campaign

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This paper discusses the effects of vegetation on C- (4.75 GHz) and L- (1.6 GHz) band backscattering (sigma degrees) measured throughout a growth cycle at incidence angles of 15, 35 and 55 degrees. The utilized sigma degrees data set was collected by a truck mounted scatterometer over a corn field and is supported by a comprehensive set of ground measurements, including soil moisture and vegetation biomass. Comparison of sigma degrees measurement against simulations by the Integral Equation Method (IEM) surface scattering model (Fung et al., 1992) shows that the sigma degrees measurements are dominated either by an attenuated soil return or by scattering from vegetation depending on the antenna configuration and growth stage. Further, the measured sigma degrees is found to be sensitive to soil moisture even at peak biomass and large incidence angles, which is attributed to scattering along the soil-vegetation pathway. For the simulation of C-band sigma degrees and the retrieval of soil moisture two methods have been applied, which are the semi-empirical water cloud model (Attema & Ulaby, 1978) and a novel method. This alternative method uses the empirical relationships between the vegetation water content (W) and the ratio of the bare soil and the measured sigma degrees to correct for vegetation. It is found that this alternative method is superior in reproducing the measured sigma degrees as well as retrieving soil moisture. The highest retrieval accuracies are obtained at a 35 degrees incidence angle leading to RMSD's of 0.044 and 0.037 m(3) m(-3) for the HH and VV-polarization, respectively. In addition, the sensitivity of these soil moisture retrievals to W and surface roughness parameter uncertainties is investigated. Published by Elsevier Inc.

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