Monte Carlo reliability model for microwave monolithic integrated circuits

A Monte Carlo simulation is reported for analog integrated circuits and is based on the modification of the failure rate of each component due to interaction affects of the failed components. The Monte Carlo technique is the methodology used to treat such circuits, since they are independent of the number of components and the degree of system complexity. The reliability model is applicable over a wide temperature and bias range and may be used to predict reliability of microwave systems. The model is compared with accelerated test results of two analog microwave circuits. Excellent agreement has been obtained for a low noise amplifier as well as for a transimpedence amplifier. Copyright (C) 2007 John Wiley & Sons, Ltd.