Journal
POWDER DIFFRACTION
Volume 29, Issue 1, Pages 76-84Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S0885715613001346
Keywords
diffraction images; synchrotron diffraction; Rietveld method; texture analysis
Funding
- NSF [EAR-0836402]
- DOE [DE-FG02-05ER15637]
- CDAC
- APS (BESSRC)
- NSF-COMPRES
- ALS
- STONE-LANL
- Directorate For Geosciences
- Division Of Earth Sciences [1343908] Funding Source: National Science Foundation
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Synchrotron X-ray diffraction images are increasingly used to characterize not only structural and microstructural features of polycrystalline materials, but also crystal preferred orientation distributions. Diffraction data can be analyzed quantitatively and efficiently with the Rietveld method and here the det9i1ed procedure is reported from the experiment to the calibration of the two-dimensional detector and full analysis of the sample. In particular, we emphasize the advantage of doing the calibration inside the Rietveld least-squares fitting instead of a preliminary graphical calibration. Then the procedure is described to quantify crystal preferred orientations with the Rietveld method implemented in software Materials Analysis Using Diffraction. The process is illustrated for a US nickel coin, a 75 at.% copper 25 at.% nickel alloy with face-centered cubic structure and a strong cube texture. (c) 2014 International Centre for Diffraction Data.
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