Journal
POWDER DIFFRACTION
Volume 28, Issue 2, Pages 68-71Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S0885715613000109
Keywords
graphene; graphene oxide; XRD; XPS; AFM
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In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive. (C) 2013 International Centre for Diffraction Data.
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