Journal
POWDER DIFFRACTION
Volume 25, Issue 2, Pages 132-137Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1154/1.3427328
Keywords
microstructure; synchrotron radiation; high energy diffraction microscopy; nondestructive orientation imaging
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Verification tests of the forward modeling technique for near-field high energy X-ray diffraction microscopy are conducted using two simulated microstructures containing uniformly distributed orientations. Comparison between the simulated and reconstructed microstructures is examined with consideration to both crystallographic orientation and spatial geometric accuracy. To probe the dependence of results on experimental parameters, simulated data sets use two different detector configurations and different simulated experimental protocols; in each case, the parameters mimic the experimental geometry used at Advanced Photon Source beamline 1-ID. Results indicate that element orientations are distinguishable to less than 0.1 degrees, while spatial geometric accuracy is limited by the detector resolution. (C) 2010 International Centre for Diffraction Data. [DOI: 10.1154/1.3427328]
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