Journal
ACTA MATERIALIA
Volume 100, Issue -, Pages 256-265Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2015.08.029
Keywords
In situ transmission electron microscopy (TEM); Mechanical properties; Silicon; Nanoparticles; Plasticity
Funding
- NSF MRSEC [DMR-0819885, DMR-1420013]
- NSF through the MRSEC program
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Silicon is one of the most technologically important materials, used extensively in electronics, solar cells, micro-electro-mechanical systems (MEMS) based devices and more. Yet its mechanical properties are not well understood at the nanoscale where it is often utilized. Experimental measurements under a variety of loading conditions are needed, and compression experiments are particularly lacking. Here, the elastic plastic response of 20-65 nm cubic Si nanocubes under uniaxial compression is investigated. The purely elastic limit of these nanocubes is observed to be up to 0.07 true strain at 7 GPa true stress with an upper yield point of 0.20 true strain and 11 GPa true stress. Investigation of the nature of dislocations generated during deformation of these nanocubes using post-mortem analysis in the TEM provides evidence that leading partial dislocations are the dominant source of plasticity at this scale. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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