4.2 Article

In situ Raman spectroscopy on kerogen at high temperatures and high pressures

Journal

PHYSICS AND CHEMISTRY OF MINERALS
Volume 37, Issue 9, Pages 593-600

Publisher

SPRINGER
DOI: 10.1007/s00269-010-0360-9

Keywords

Kerogen; Raman spectroscopy; Graphitization process; High temperatures and high pressures

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Kerogen samples were treated at temperatures and pressures up to 25-600 degrees C and similar to 9 GPa, respectively. In situ micro-Raman spectroscopy was used to measure the systematic changes in the first-order Raman spectral features during the process of temperature or pressure increment. Three Raman bands, D1, D2, and G bands, were examined to characterize the structural and chemical changes of kerogen at high temperatures and pressures. We found that the wavenumbers of D1, D2 and G bands showed a linear variation with both temperature and pressure. Therefore, a correlation between R1 and R2 and the peak temperature in regionally metamorphosed rocks cannot be applied to this work. This result implies that the G band may serve as a temperature or pressure indicator during the promotion of Maturation of kerogen. Kerogen possesses reversible properties in contrast with the natural samples recovered from the field suffered from prolonged thermal history during regional metamorphism.

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