Journal
PHYSICAL REVIEW LETTERS
Volume 112, Issue 5, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.112.053903
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Funding
- JSPS [25.2959]
- Ministry of Education, Culture, Sports, Science and Technology
- [25709057]
- Grants-in-Aid for Scientific Research [13J02959] Funding Source: KAKEN
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We report the first demonstration of hard x-ray ptychography using a multislice approach, which can solve the problem of the limited spatial resolution under the projection approximation. We measured ptychographic diffraction patterns of a two-layered object with a 105 mu m gap using 7 keV focused coherent x rays. We successfully reconstructed the phase map of each layer at similar to 50 nm resolution using a multislice approach, while the resolution was worse than similar to 192 nm under the projection approximation. The present method has the potential to enable the three-dimensional high-resolution observation of extended thick specimens in materials science and biology.
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