Journal
PHYSICAL REVIEW LETTERS
Volume 108, Issue 7, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.108.073003
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- Max-Planck Advanced Study Group at CFEL
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The strong-field induced decay of a doubly excited, transient Coulomb complex Ar** -> Ar2+ + 2e(-) is explored by tracing correlated two-electron emission in nonsequential double ionization of Ar as a function of the carrier-envelope phase. Using <6 fs pulses, electron emission is essentially confined to one optical cycle. Classical model calculations support that the intermediate Coulomb complex has lost memory of its formation dynamics and allows for a consistent, though model-dependent definition of emission time, empowering us to trace transition-state two-electron decay dynamics with sub-fs resolution. We find a most likely emission time difference of similar to 200 +/- 100 as.
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