Journal
PHYSICAL REVIEW LETTERS
Volume 108, Issue 18, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.108.186402
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Funding
- Stichting voor Fundamenteel Onderzoek der Materie (FOM)
- Netherlands Organization for Scientific Research (NWO)
- European Research Council (ERC)
- U.S. Department of Energy [DE-FG02-05ER46203]
- Italian Ministry of Education, University, and Research (MIUR)
- U.S. Department of Energy (DOE) [DE-FG02-05ER46203] Funding Source: U.S. Department of Energy (DOE)
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The onset of exciton condensation in a topological insulator thin film was recently predicted. We calculate the critical temperature for this transition, taking into account screening effects. Furthermore, we show that the proximity to this transition can be probed by measuring the Coulomb drag resistivity between the surfaces of the thin film as a function of temperature. This resistivity shows an upturn upon approaching the exciton-condensed state.
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