Journal
PHYSICAL REVIEW LETTERS
Volume 109, Issue 18, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.109.187404
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Funding
- French Agence Nationale de la Recherche [ANR-08-NANO-P053-36]
- Regional Council of Burgundy
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We demonstrate experimentally a subdiffraction light pattern, with a period down to 150 nm, at the surface of an optimized silicon nanostructured thin film. We show, using near-field and far-field characterization, that this subdiffraction pattern can be translated and rotated just by changing the illumination angle. The movable high frequency light pattern paves the way for subdiffraction resolution surface imaging microscopy without scanning near-field probes.
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