4.8 Article

Atomic-Scale Compensation Phenomena at Polar Interfaces

Journal

PHYSICAL REVIEW LETTERS
Volume 105, Issue 19, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.105.197602

Keywords

-

Funding

  1. Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy [DE-AC05-00OR22725, DE-FG02-09ER46554]
  2. McMinn Endowment at Vanderbilt University
  3. ORNL

Ask authors/readers for more resources

The interfacial screening charge that arises to compensate electric fields of dielectric or ferroelectric thin films is now recognized as the most important factor in determining the capacitance or polarization of ultrathin ferroelectrics. Here we investigate using aberration-corrected electron microscopy and density-functional theory to show how interfaces cope with the need to terminate ferroelectric polarization. In one case, we show evidence for ionic screening, which has been predicted by theory but never observed. For a ferroelectric film on an insulating substrate, we found that compensation can be mediated by an interfacial charge generated, for example, by oxygen vacancies.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.8
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available