Journal
PHYSICAL REVIEW LETTERS
Volume 100, Issue 6, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.100.066602
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Temperature dependence of spin relaxation process in a Cu wire has been studied by means of nonlocal spin-valve measurements. The spin-diffusion length of the Cu wire is found to take maximum at the characteristic temperature, below which the spin-diffusion length is reduced. The mechanism of the reduction can be explained by considering the spin-flip scattering due to the oxidized surface of the Cu wire. The thickness dependence of the characteristic temperature supports the interpretation with the surface oxidation.
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