Journal
PHYSICAL REVIEW LETTERS
Volume 100, Issue 7, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.100.076102
Keywords
-
Categories
Ask authors/readers for more resources
We develop a theory that explains the origin of the high force sensitivity observed in multifrequency force microscopy experiments. The ability of the microscope to extract complementary information on the surface properties is increased by the simultaneous excitation of several flexural cantilever modes. The force sensitivity in multifrequency operation is about 0.2 pN. The analytical model identifies the virial and the energy dissipated by the tip-surface forces as the parameters responsible for the material contrast. The agreement obtained among the theory, experiments and numerical simulations validates the model.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available