Journal
PHYSICAL REVIEW LETTERS
Volume 101, Issue 10, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.101.107602
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Funding
- National Science Foundation [ECCS-0708759, DMR-0507146, DMR-0820404]
- Office of Naval Research [N0001407-1-0215, N00014-04-1-0426]
- Department of Energy [DE-FG02-07ER46417]
- Division of Scientific User Facilities, Basic Energy Sciences, US DOE
- U.S. Department of Energy (DOE) [DE-FG02-07ER46417] Funding Source: U.S. Department of Energy (DOE)
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [820404] Funding Source: National Science Foundation
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Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO(3) thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO(3) films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO(3) with biaxial strain while the spontaneous polarization itself remains almost constant.
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