Journal
PHYSICAL REVIEW LETTERS
Volume 101, Issue 6, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.101.066806
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Funding
- European Commission
- [R113-CT-2004-506008]
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We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO(2) substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single- layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.
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