Journal
PHYSICAL REVIEW B
Volume 89, Issue 10, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.89.104106
Keywords
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Funding
- European Research Council (ERC Advanced Grant FEMMES) [267579]
- French Agence Nationale de la Recherche (ANR)
- NSERC
- Region Poitou-Charente
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We revisit the atomic structure and microstructure of the so-called supertetragonal phases of highly strained epitaxial BiFeO3 thin films. Quantitative atomic resolution scanning transmission electron microscopy is used to directly image the atomic positions. A crystallographic phase suggested by electron diffraction and predicted by ab initio calculations is evidenced. Microtwins are reported in thickest films. Electron energy loss spectroscopy is further employed to reveal subtle electronic structure features, which, interpreted in a framework of antiferrodistortive distortions coupling with the substrate, point towards a phase closer to the P4mm purely tetragonal phase.
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