Journal
PHYSICAL REVIEW B
Volume 87, Issue 6, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.87.064107
Keywords
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Funding
- Research Foundation Flanders (FWO, Belgium)
- European Union [262348 ESMI, 312483 ESTEEM2]
- ERC [246791 COUNTATOMS]
- Flemish Hercules 3 programme
- DFG [RO2057/8-1]
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We report a method to reliably count the number of atoms from high-angle annular dark field scanning transmission electron microscopy images. A model-based analysis of the experimental images is used to measure scattering cross sections at the atomic level. The high sensitivity of these measurements in combination with a thorough statistical analysis enables us to count atoms with single-atom sensitivity. The validity of the results is confirmed by means of detailed image simulations. We will show that the method can be applied to nanocrystals of arbitrary shape, size, and atom type without the need for a priori knowledge about the atomic structure. DOI: 10.1103/PhysRevB.87.064107
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