Journal
PHYSICAL REVIEW B
Volume 87, Issue 6, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.87.060101
Keywords
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Funding
- DOE [DEFG02-02ER45994]
- NSF [DMR-1121053]
- MURI from the Army Research Office [W911-NF-09-1-0398]
- Center for Scientific Computing at the California Nanosystems Institute and Materials Research Laboratory in UC Santa Barbara [NSF CNS-0960316]
- Direct For Computer & Info Scie & Enginr
- Division Of Computer and Network Systems [960316] Funding Source: National Science Foundation
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NiO6 octahedral tilts in the LaNiO3/SrTiO3 superlattices are quantified using position averaged convergent beam electron diffraction in scanning transmission electron microscopy. It is shown that maintaining oxygen octahedra connectivity across the interface controls the octahedral tilts in the LaNiO3 layers, their lattice parameters, and their transport properties. Unlike films and layers that are connected on one side to the substrate, subsequent LaNiO3 layers in the superlattice exhibit a relaxation of octahedral tilts towards bulk values. This relaxation is facilitated by tilts in the SrTiO3 layers and is correlated with the conductivity enhancement of the LaNiO3 layers in the superlattices relative to individual films. DOI: 10.1103/PhysRevB.87.060101
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