Related references
Note: Only part of the references are listed.Theoretical simulation of Kelvin probe force microscopy for Si surfaces by taking account of chemical forces
Masaru Tsukada et al.
JOURNAL OF PHYSICS-CONDENSED MATTER (2012)
Imaging the charge distribution within a single molecule
Fabian Mohn et al.
NATURE NANOTECHNOLOGY (2012)
Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions
Robert Baier et al.
PHYSICAL REVIEW B (2012)
Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods
Clemens Barth et al.
ADVANCED MATERIALS (2011)
Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms
Franck Bocquet et al.
PHYSICAL REVIEW B (2011)
Interaction-induced atomic displacements revealed by drift-corrected dynamic force spectroscopy
Shigeki Kawai et al.
PHYSICAL REVIEW B (2011)
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
A. J. Weymouth et al.
PHYSICAL REVIEW LETTERS (2011)
Chemical Resolution at Ionic Crystal Surfaces Using Dynamic Atomic Force Microscopy with Metallic Tips
G. Teobaldi et al.
PHYSICAL REVIEW LETTERS (2011)
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition
Yukinori Kinoshita et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2011)
The role of the cantilever in Kelvin probe force microscopy measurements
George Elias et al.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2011)
Accurate formula for conversion of tunneling current in dynamic atomic force spectroscopy
John E. Sader et al.
APPLIED PHYSICS LETTERS (2010)
Atomic contact potential variations of Si(111)-7 x 7 analyzed by Kelvin probe force microscopy
Shigeki Kawai et al.
NANOTECHNOLOGY (2010)
AFM tip characterization by Kelvin probe force microscopy
C. Barth et al.
NEW JOURNAL OF PHYSICS (2010)
Simulation method of Kelvin probe force microscopy at nanometer range and its application
A. Masago et al.
PHYSICAL REVIEW B (2010)
Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface
Yoshiaki Sugimoto et al.
PHYSICAL REVIEW B (2010)
Work Function Measurements of Thin Oxide Films on Metals-MgO on Ag(001)
T. Koenig et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2009)
Adsorption of small NaCl clusters on surfaces of silicon nanostructures
Maximilian Amsler et al.
NANOTECHNOLOGY (2009)
Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals
Th Glatzel et al.
NANOTECHNOLOGY (2009)
On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy
Laurent Nony et al.
NANOTECHNOLOGY (2009)
New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors
Sascha Sadewasser et al.
PHYSICAL REVIEW LETTERS (2009)
Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy
Laurent Nony et al.
PHYSICAL REVIEW LETTERS (2009)
The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
Leo Gross et al.
SCIENCE (2009)
Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
Leo Gross et al.
SCIENCE (2009)
Real versus measured surface potentials in scanning Kelvin probe microscopy
Dimitri S. H. Charrier et al.
ACS NANO (2008)
Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
Y. Shen et al.
ENGINEERING ANALYSIS WITH BOUNDARY ELEMENTS (2008)
Daubechies wavelets as a basis set for density functional pseudopotential calculations
Luigi Genovese et al.
JOURNAL OF CHEMICAL PHYSICS (2008)
3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy:: II.: Rectangular shaped cantilevers with asymmetric pyramidal tips
Giovanni Valdre et al.
NANOTECHNOLOGY (2008)
Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution
F. Krok et al.
PHYSICAL REVIEW B (2008)
Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy
Franck Bocquet et al.
PHYSICAL REVIEW B (2008)
Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy
S. Alireza Ghasemi et al.
PHYSICAL REVIEW LETTERS (2008)
Atomic scale kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface
G. H. Enevoldsen et al.
PHYSICAL REVIEW LETTERS (2008)
Atomic-Scale Force-Vector Fields
Kai Ruschmeier et al.
PHYSICAL REVIEW LETTERS (2008)
Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations
Yongxing Shen et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2008)
On large-scale diagonalization techniques for the Anderson model of localization
Olaf Schenk et al.
SIAM REVIEW (2008)
Kelvin force microscopy at the second cantilever resonance:: An out-of-vacuum crosstalk compensation setup
H. Diesinger et al.
ULTRAMICROSCOPY (2008)
Vertical and lateral electrostatic forces in a tip-plane system studied with a Green function plus surface charge method
J. Konior
JOURNAL OF APPLIED PHYSICS (2007)
Matching-based preprocessing algorithms to the solution of saddle-point problems in large-scale nonconvex interior-point optimization
Olaf Schenk et al.
COMPUTATIONAL OPTIMIZATION AND APPLICATIONS (2007)
Surface double layer on (001) surfaces of alkali halide crystals: A scanning force microscopy study
Clemens Barth et al.
PHYSICAL REVIEW LETTERS (2007)
A method for calculating capacitances and electrostatic forces in atomic force microscopy
G. M. Sacha et al.
JOURNAL OF APPLIED PHYSICS (2007)
Efficient solution of Poisson's equation with free boundary conditions
Luigi Genovese et al.
JOURNAL OF CHEMICAL PHYSICS (2006)
Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)-(7x7) surface by bias-voltage noncontact atomic force spectroscopy
T Arai et al.
PHYSICAL REVIEW B (2006)
Reconstruction of electrostatic force microscopy images
E Strassburg et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2005)
Accuracy and resolution limits of Kelvin probe force microscopy -: art. no. 125424
U Zerweck et al.
PHYSICAL REVIEW B (2005)
Sublattice identification in scanning force microscopy on alkali halide surfaces -: art. no. 146103
R Hoffmann et al.
PHYSICAL REVIEW LETTERS (2004)
Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
JE Sader et al.
APPLIED PHYSICS LETTERS (2004)
Cantilever effects on electrostatic force gradient microscopy
GM Sacha et al.
APPLIED PHYSICS LETTERS (2004)
Observation of electronic states on Si(111)-(7 x 7) through short-range attractive force with noncontact atomic force spectroscopy
T Arai et al.
PHYSICAL REVIEW LETTERS (2004)
Minima hopping: An efficient search method for the global minimum of the potential energy surface of complex molecular systems
S Goedecker
JOURNAL OF CHEMICAL PHYSICS (2004)
A density functional study of adsorption of sodium-chloride overlayers on a stepped and a flat copper surface
FE Olsson et al.
SURFACE SCIENCE (2003)
Advances in atomic force microscopy
FJ Giessibl
REVIEWS OF MODERN PHYSICS (2003)
Amplitude or frequency modulation-detection in Kelvin probe force microscopy
T Glatzel et al.
APPLIED SURFACE SCIENCE (2003)
KPFM imaging of Si(111)5√3 x 5√3-Sb surface for atom distinction using NC-AFM
K Okamoto et al.
APPLIED SURFACE SCIENCE (2003)
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
S Sadewasser et al.
APPLIED SURFACE SCIENCE (2003)
High-resolution work function imaging of single grains of semiconductor surfaces
S Sadewasser et al.
APPLIED PHYSICS LETTERS (2002)
The elimination of the 'artifact' in the electrostatic force measurement using a novel noncontact atomic force micro scope/electrostatic force microscope
K Okamoto et al.
APPLIED SURFACE SCIENCE (2002)
Resolution enhancement and improved data interpretation in electrostatic force microscopy -: art. no. 245403
J Colchero et al.
PHYSICAL REVIEW B (2001)
Electrostatic forces between sharp tips and metallic and dielectric samples
S Gómez-Moñivas et al.
APPLIED PHYSICS LETTERS (2001)
Tip-shape effects on electrostatic force microscopy resolution
S Gómez-Moñivas et al.
NANOTECHNOLOGY (2001)
Quantitative measurement of short-range chemical bonding forces
MA Lantz et al.
SCIENCE (2001)
Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface
M Guggisberg et al.
SURFACE SCIENCE (2000)
Atomically resolved edges and kinks of NaCl islands on Cu(111):: Experiment and theory
R Bennewitz et al.
PHYSICAL REVIEW B (2000)
Separation of interactions by noncontact force microscopy
M Guggisberg et al.
PHYSICAL REVIEW B (2000)
Atomic-scale variations in contact potential difference on Au/Si(111) 7 X 7 surface in ultrahigh vacuum
S Kitamura et al.
APPLIED SURFACE SCIENCE (2000)
Electrostatic energy calculation for the interpretation of scanning probe microscopy experiments
LN Kantorovich et al.
JOURNAL OF PHYSICS-CONDENSED MATTER (2000)
Role of image forces in non-contact scanning force microscope images of ionic surfaces
LN Kantorovich et al.
SURFACE SCIENCE (2000)