Journal
PHYSICAL REVIEW B
Volume 85, Issue 20, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.85.201405
Keywords
-
Funding
- Italian Ministry of Education, University, and Research (MIUR)
- Stichting voor Fundamenteel Onderzoek der Materie (FOM) (The Netherlands)
Ask authors/readers for more resources
It is widely believed that carrier-density inhomogeneities (electron-hole puddles) in single-layer graphene on a substrate such as quartz are due to charged impurities located close to the graphene sheet. Here we demonstrate by using a Kohn-Sham-Dirac density-functional scheme that corrugations in a real sample are sufficient to determine electron-hole puddles on length scales that are larger than the spatial resolution of state-of-the-art scanning tunneling microscopy.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available