Journal
PHYSICAL REVIEW B
Volume 83, Issue 3, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.83.035410
Keywords
-
Funding
- EPSRC [EP/E025722/1]
- JEOL UK
- Christchurch College, Oxford
- Engineering and Physical Sciences Research Council [EP/E025722/1] Funding Source: researchfish
- EPSRC [EP/E025722/1] Funding Source: UKRI
Ask authors/readers for more resources
High resolution X-ray photoelectron spectroscopy (XPS) was performed on the (001) surfaces of Nb-doped and La-doped single crystals of SrTiO3. For the Nb-doped samples the XPS results demonstrate that the fraction of Ti3+ ions increases with increasing Nb dopant concentration. The Nb dopants are shown to be in a 5+ ionization state. Atomic resolution scanning tunneling microscopy (STM) images of the 0.7 at.% Nb-doped SrTiO3(001) surface show that Nb-dopant atoms can be imaged on the surface as bright four-point square clusters. No evidence of Nb segregation to the (001) surface was found under ultrahigh vacuum (UHV) annealing. However, UHV annealing of the 0.7 at.% La-doped SrTiO3(001) samples at 1400 degrees C for 1 h resulted in La surface segregation as determined by Auger electron spectroscopy. STM on these samples shows that the segregated La results in La-rich linear surface structures.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available