Journal
PHYSICAL REVIEW B
Volume 83, Issue 8, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.83.085408
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Funding
- Office of Science, Division of Materials Sciences and Engineering, US Department of Energy
- Office of Biological and Environmental Research of the Department of Energy, Pacific Northwest National Laboratory
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LaAlO3 epitaxial films with La:Al cation ratios ranging from 0.9 to 1.2 were grown on TiO2-terminated SrTiO3 (001) substrates by off-axis pulsed laser deposition. Although all films are epitaxial, rocking curve measurements show that the crystallographic quality degrades with increasing La: Al ratio. Films with La: Al ratios of 0.9, 1.0, and 1.1 were coherently strained to the substrate. However, the out-of-plane lattice parameter increases over this range, revealing a decrease in film tetragonality. Although all film surfaces exhibit hydroxylation, the extent of hydroxylation is greater for the La-rich films. Rutherford backscattering spectrometry reveals that La from the film diffuses deeply into the SrTiO3 substrate and secondary-ion-mass spectroscopy shows unambiguous Sr outdiffusion into the films.
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