Journal
PHYSICAL REVIEW B
Volume 84, Issue 9, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.84.094413
Keywords
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Funding
- Bundesministerium fur Bildung und Forschung [FKZ 13N10144]
- Deutsche Forschungsgemeinschaft [SCHM1663/1-2]
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We performed generalized Mueller matrix ellipsometry measurements in a magnetic field of arbitrary orientation and magnitude up to 400 mT at room temperature and probed the magneto-optical response of capped, ferromagnetic Fe, Ni(20)Fe(80), Co, Ni(80)Fe(20), and Ni thin films on ZnO substrates in the spectral range from 300 to 1100 nm. We determined the off-diagonal elements in the magneto-optical dielectric tensor under saturated magnetization conditions in the sample surface plane via a model analysis. The off-diagonal elements depend on the net spin polarization and the electronic band structure of the ferromagnetic thin films. For the pure ferromagnetic metals Fe, Co, and Ni, the converted off-diagonal elements agree well with the reported experimental optical conductivity data. As a result we use the extracted wavelength-dependent magneto-optical coupling constant to predict the wavelength-dependent magneto-optical response of different Ni/Fe multilayer structures.
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