4.6 Article

Polarization-resolved fine-structure splitting of zero-dimensional InxGa1-xN excitons

Journal

PHYSICAL REVIEW B
Volume 83, Issue 20, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.83.201307

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Funding

  1. Thaksin University in Thailand
  2. Swedish Research Council (VR)
  3. Swedish Foundation for Strategic Research (SSF)
  4. Knut and Alice Wallenberg Foundation

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The fine-structure splitting of quantum confined InxGa1-x Nexcitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100-340 mu eV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.

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