Journal
PHYSICAL REVIEW B
Volume 84, Issue 23, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.84.235206
Keywords
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Funding
- NSF MRSEC [DMR-0819860]
- SPAWAR [N6601-11-1-4110]
- AFOSR [FA9550-10-1-0533]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [819860] Funding Source: National Science Foundation
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We report the characterization of Bi2Te2Se crystals obtained by the modified Bridgman and Bridgman-Stockbarger crystal-growth techniques. X-ray-diffraction study confirms an ordered Se-Te distribution in the inner and outer chalcogen layers, respectively, with a small amount of mixing. The crystals displaying high resistivity (>1 Omega cm) and low carrier concentration (similar to 5 x 10(16)/cm(3)) at 4 K were found in the central region of the long Bridgman-Stockbarger crystal, which we attribute to very small differences in defect density along the length of the crystal rod. Analysis of the temperature-dependent resistivities and Hall coefficients reveals the possible underlying origins of the donors and acceptors in this phase.
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