Related references
Note: Only part of the references are listed.Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2x8) surface
Daisuke Sawada et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2010)
Simultaneous measurement of force and tunneling current at room temperature
Daisuke Sawada et al.
APPLIED PHYSICS LETTERS (2009)
The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface
Yoshitaka Naitoh et al.
NANOTECHNOLOGY (2009)
The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
Leo Gross et al.
SCIENCE (2009)
High-spatial-resolution topographic imaging and dimer distance analysis of Si(100)-(2x1) using noncontact atomic force microscopy
Daisuke Sawada et al.
JAPANESE JOURNAL OF APPLIED PHYSICS (2008)
Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface
Georg H. Enevoldsen et al.
PHYSICAL REVIEW B (2008)
Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy
Yoshiaki Sugimoto et al.
PHYSICAL REVIEW B (2008)
Tip-Induced Reduction of the Resonant Tunneling Current on Semiconductor Surfaces
Pavel Jelinek et al.
PHYSICAL REVIEW LETTERS (2008)
Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Yoshiaki Sugimoto et al.
SCIENCE (2008)
The force needed to move an atom on a surface
Markus Ternes et al.
SCIENCE (2008)
Dynamic force spectroscopy using cantilever higher flexural modes
Yoshiaki Sugimoto et al.
APPLIED PHYSICS LETTERS (2007)
Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy
Masayuki Abe et al.
APPLIED PHYSICS LETTERS (2007)
Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Yoshiaki Sugimoto et al.
PHYSICAL REVIEW LETTERS (2007)
Chemical identification of individual surface atoms by atomic force microscopy
Yoshiaki Sugimoto et al.
NATURE (2007)
WSXM: A software for scanning probe microscopy and a tool for nanotechnology
I. Horcas et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2007)
Highly resolved non-contact atomic force microscopy images of the Sn/Si(111)-(2√3 x 2√3) surface
Yoshiaki Sugimoto et al.
NANOTECHNOLOGY (2006)
Room-temperature reproducible spatial force spectroscopy using atom-tracking technique
M Abe et al.
APPLIED PHYSICS LETTERS (2005)
Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite
S Hembacher et al.
PHYSICAL REVIEW LETTERS (2005)
Tip and surface determination from experiments and simulations of scanning tunneling microscopy and spectroscopy -: art. no. 056103
O Paz et al.
PHYSICAL REVIEW LETTERS (2005)
Atom inlays performed at room temperature using atomic force microscopy
Y Sugimoto et al.
NATURE MATERIALS (2005)
Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
JE Sader et al.
APPLIED PHYSICS LETTERS (2004)
Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor
FJ Giessibl et al.
NANOTECHNOLOGY (2004)
Imaging of all dangling bonds and their potential on the Ge/Si(105) surface by noncontact atomic force microscopy
T Eguchi et al.
PHYSICAL REVIEW LETTERS (2004)
Force microscopy with light-atom probes
S Hembacher et al.
SCIENCE (2004)
High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
A Oral et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2003)
Advances in atomic force microscopy
FJ Giessibl
REVIEWS OF MODERN PHYSICS (2003)
Quantitative measurement of short-range chemical bonding forces
MA Lantz et al.
SCIENCE (2001)
A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy
FJ Giessibl
APPLIED PHYSICS LETTERS (2001)
Dynamic force microscopy of copper surfaces:: Atomic resolution and distance dependence of tip-sample interaction and tunneling current
C Loppacher et al.
PHYSICAL REVIEW B (2000)
Subatomic features on the silicon (111)-(7x7) surface observed by atomic force microscopy
FJ Giessibl et al.
SCIENCE (2000)
Simultaneous imaging of tunneling current variation by noncontact atomic force microscopy in ultrahigh vacuum
T Arai et al.
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS (2000)
Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes
H Hölscher et al.
PHYSICAL REVIEW B (2000)
Physical interpretation of frequency-modulation atomic force microscopy
FJ Giessibl et al.
PHYSICAL REVIEW B (2000)
Separation of interactions by noncontact force microscopy
M Guggisberg et al.
PHYSICAL REVIEW B (2000)
Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
FJ Giessibl
APPLIED PHYSICS LETTERS (2000)
Share Paper
